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ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
COMPRESSIVE IMAGING AND DUAL MOIRÉ LASER INTERFEROMETER AS METROLOGY TOOLS
COMPRESSIVE IMAGING AND DUAL MOIRÉ LASER INTERFEROMETER AS METROLOGY TOOLS
Complex photonic crystals for broadband "all-angle" self-collimation
Complex photonic crystals for broadband "all-angle" self-collimation
Design, Fabrication and Testing of Hierarchical Micro-optical Structures and Systems
Design, Fabrication and Testing of Hierarchical Micro-optical Structures and Systems
EXTERNAL WAVELENGTH STABILIZATION OF GRATING COUPLED SURFACE EMITTING LASERS AND APPLICATIONS
EXTERNAL WAVELENGTH STABILIZATION OF GRATING COUPLED SURFACE EMITTING LASERS AND APPLICATIONS
Effects of Edge Roughness on Optical Scattering from Periodic Microstructures
Effects of Edge Roughness on Optical Scattering from Periodic Microstructures
Effects of Edge Roughness on Optical Scattering from Periodic Microstructures
Electromagnetic Wave Phenomena In Periodic Metastructures
Electromagnetic Wave Phenomena In Periodic Metastructures
Electromagnetic Wave Phenomena In Periodic Metastructures
Enhanced electron mobility at Gd2O3(100)/Si(100) interface: origin and applications
Enhanced electron mobility at Gd2O3(100)/Si(100) interface: origin and applications
FOURIER-BASED IMAGE SHARPNESS SENSOR FOR ADAPTIVE OPTICS CORRECTION
FOURIER-BASED IMAGE SHARPNESS SENSOR FOR ADAPTIVE OPTICS CORRECTION