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Spatially Resolved Photoluminescence Lifetime Mapping in the Vicinity of Extended Defects in Semiconductors Using a Time Correlated Single Photon Counting System and Confocal Photoluminescence Microscopy
Title
Spatially Resolved Photoluminescence Lifetime Mapping in the Vicinity of Extended Defects in Semiconductors Using a Time Correlated Single Photon Counting System and Confocal Photoluminescence Microscopy
Author
Mode, Timothy
Date Created
2016
Description
Photoluminescence mapping and time resolved photoluminescence imaging have previously been used to study charge carrier dynamics in bulk semiconductors. Recently, our research group has used spatially resolved PL mapping to examine and model carri...
Spatially Resolved Photoluminescence Lifetime Mapping in the Vicinity of Extended Defects in Semiconductors Using a Time Correlated Single Photon Counting System and Confocal Photoluminescence Microscopy
Title
Spatially Resolved Photoluminescence Lifetime Mapping in the Vicinity of Extended Defects in Semiconductors Using a Time Correlated Single Photon Counting System and Confocal Photoluminescence Microscopy
Author
Mode, Timothy
Date Created
2016
Subjects--Topical
Optics, Physics
Description
Photoluminescence mapping and time resolved photoluminescence imaging have previously been used to study charge carrier dynamics in bulk semiconductors. Recently, our research group has used spatially resolved PL mapping to examine and model carri...